PHOTON ENERGY DEPENDENCE OF PHASE CONTRAST SYNCHROTRON LIGHT IMAGING

A. Groso, G. Margaritondo, Y. Hwu, Wen-Li Tsai, J. H. Je and B. Lai
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A. Groso: Institut de Physique Appliquée, Ecole Polytechnique Fédérale de Lausanne, CH-1015, Lausanne, Switzerland
G. Margaritondo: Institut de Physique Appliquée, Ecole Polytechnique Fédérale de Lausanne, CH-1015, Lausanne, Switzerland
Y. Hwu: Institute of Physics, Academia Sinica, Taipei, Taiwan, R.O.C
Wen-Li Tsai: Institute of Physics, Academia Sinica, Taipei, Taiwan, R.O.C
J. H. Je: Department of Material Science and Engineering, Pohang University of Science and Technology, Pohang, Korea
B. Lai: Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois, USA

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 567-570

Abstract: The changes in phase contrast X-ray images as the photon energy is changed were observed and analyzed. Such results were justified in part with a preliminary model based on the interplay of refraction and absorption effects. The observed change may open up interesting opportunities for chemical analysis based on phase contrast images taken at different absorption edges.

Date: 2002
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DOI: 10.1142/S0218625X02002658

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