MULTILAYER POLARIZERS FOR THE USE OF He-I AND He-II RESONANCE LINES

Tadashi Hatano, Yuzi Kondo, Katsuhiko Saito, Takeo Ejima, Makoto Watanabe and Masahiko Takahashi
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Tadashi Hatano: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Yuzi Kondo: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Katsuhiko Saito: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Takeo Ejima: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Makoto Watanabe: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
Masahiko Takahashi: Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

Surface Review and Letters (SRL), 2002, vol. 09, issue 01, 587-591

Abstract: Multilayer polarizers for the use of He resonance lines have been developed. Si/Mg and SiC/Mg multilayers were designed and fabricated for the He-I and He-II resonance lines, respectively. The performance was checked by the use of synchrotron radiation. The polarizance ands-reflectance of the He-II polarizer measured at an angle of incidence of 40° were 0.98 and 41%, respectively. The polarizance of the He-I polarizer measured at an angle of incidence of 31.5° was 0.96.

Date: 2002
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DOI: 10.1142/S0218625X02002695

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