X-RAY RAMAN SCATTERING FROM LOWZMATERIALS

Michael Krisch and Francesco Sette
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Michael Krisch: European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France
Francesco Sette: European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France

Surface Review and Letters (SRL), 2002, vol. 09, issue 02, 969-976

Abstract: X-ray Raman scattering from core electrons of lowZmaterials provides an alternative to soft X-ray absorption spectroscopy in cases where (i) exotic final states will be probed, (ii) the penetrating power of hard X rays is needed to study bulk properties, and (iii) when systems under high pressure are studied. The theoretical background and experimental requirements are discussed. The present capabilities of the technique are illustrated by two experiments, performed on the inelastic X ray scattering beamlines at the European Synchrotron Radiation Facility.

Date: 2002
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DOI: 10.1142/S0218625X02001689

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