MAGNETIC COUPLING IN THIN LAYERS AND SUPERLATTICES INVESTIGATED BY RESONANT SCATTERING OF POLARIZED SOFT X-RAYS
Maurizio Sacchi and
Coryn F. Hague
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Maurizio Sacchi: LURE, Centre Universitaire Paris-Sud, BP 34, F-91898 Orsay, France
Coryn F. Hague: LURE, Centre Universitaire Paris-Sud, BP 34, F-91898 Orsay, France;
Surface Review and Letters (SRL), 2002, vol. 09, issue 02, 811-820
Abstract:
A short overview is given of recent developments in the use of resonant scattering of polarized soft X-rays to investigate magnetic materials. A few studies are chosen to exemplify possible applications in the field of thin films and ordered multilayer structures.
Date: 2002
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Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02001823
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DOI: 10.1142/S0218625X02001823
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