MAGNETIC MICROSPECTROSCOPY BY A COMBINATION OF XMCD AND PEEM

S. Imada, S. Suga, W. Kuch and J. Kirschner
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S. Imada: Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka 560-8531, Japan
S. Suga: Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka 560-8531, Japan
W. Kuch: Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany
J. Kirschner: Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany

Surface Review and Letters (SRL), 2002, vol. 09, issue 02, 877-881

Abstract: The benefits of combining soft X-ray magnetic circular dichroism and photoelectron microscopy are demonstrated by applying this combination (XMCD–PEEM) not only to magnetic domain imaging but also to quantitative evaluation of the distribution of spin and orbital magnetic moments. The latter takes full advantage of the spectroscopic aspect of XMCD–PEEM.

Date: 2002
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DOI: 10.1142/S0218625X02003093

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