EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

P. Luches (), C. Giovanardi, T. Moia, S. Valeri, F. Bruno, L. Floreano, R. Gotter, A. Verdini, A. Morgante and A. Santaniello
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P. Luches: INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy
C. Giovanardi: INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy
T. Moia: INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy
S. Valeri: INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Via G. Campi 213/a, 41100 Modena, Italy
F. Bruno: Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy
L. Floreano: Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy
R. Gotter: Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy
A. Verdini: Laboratorio TASC-INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy
A. Morgante: Laboratorio TASC–INFM, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy;
A. Santaniello: Sincrotrone Trieste, S.S. 14, Km 163.5, Basovizza, 34012 Trieste, Italy

Surface Review and Letters (SRL), 2002, vol. 09, issue 02, 937-941

Abstract: CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

Date: 2002
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DOI: 10.1142/S0218625X0200324X

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