RESONANT INELASTIC SOFT X-RAY SCATTERING OF INSULATING CUPRATES

L.-C. Duda, T. Schmitt, J. Nordgren, G. Dhalenne and A. Revcolevschi
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L.-C. Duda: Department of Physics, Uppsala University, Ångström Laboratory, Lägerhyddsv. 1, 752 37 Uppsala, Sweden
T. Schmitt: Department of Physics, Uppsala University, Ångström Laboratory, Lägerhyddsv. 1, 752 37 Uppsala, Sweden
J. Nordgren: Department of Physics, Uppsala University, Ångström Laboratory, Lägerhyddsv. 1, 752 37 Uppsala, Sweden
G. Dhalenne: Laboratoire de Chimie des Solides, Unité Associe au CNRS 446, Université de Paris-Sud, Bâtiment 414, F-91405 Orsay, Cedex, France
A. Revcolevschi: Laboratoire de Chimie des Solides, Unité Associe au CNRS 446, Université de Paris-Sud, Bâtiment 414, F-91405 Orsay, Cedex, France

Surface Review and Letters (SRL), 2002, vol. 09, issue 02, 1103-1108

Abstract: We have performed high-resolution inelastic X-ray emission scattering experiments at the Cu 3p-, Cu 3s-, and O 1s-resonances of the insulating cupratesCuGeO3, CuO,La2CuO4, andSrCuO2. We introduce the novellow-energys-edge Cu-RIXS which reveals a dd-excitation peak, which was previously unobserved due to insufficient resolution and intensity in high-energy (Cu 1s RIXS). Also, O 1s-RIXS of all cuprate sample is investigated. Surprisingly, there is a large spread in the energy loss values of the RIXS features for different compounds and we explain this by assigning the larger energy features to the occurrence of a Zhang–Rice singlet while the lower energy feature (only observed forCuGeO3) is assigned to a dd-excitation.

Date: 2002
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DOI: 10.1142/S0218625X0200341X

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