DETERMINATION OF THE OPTICAL CONSTANTS OFInxSeyTHIN FILMS DEPOSITED BY EVAPORATION AND COEVAPORATION

J. Sandino and G. Gordillo ()
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J. Sandino: Departamento de Física, Universidad Nacional de Colombia, Colombia
G. Gordillo: Departamento de Física, Universidad Nacional de Colombia, Colombia

Surface Review and Letters (SRL), 2002, vol. 09, issue 05n06, 1687-1691

Abstract: InxSeythin films, grown on soda lime glass substrates in theIn6Se7phase by evaporation of theIn2Se3compound and in theIn2Se3phase by coevaporation of In and Se, were optically characterized through spectral transmittance measurements. A special procedure was developed to determine the thicknessdand the optical constants (refractive indexn, absorption coefficient α, and optical gapEg). This includes experimental measurements of the spectral transmittance and the use of a model taking into account interference effects induced by internal reflections presented in the interfaces substrate/film and film/air and the fitting of thenvs. λ curve to the Cauchy equation(n = A + B/λ2). The optical constants of theInxSeythin films were corrected comparing the experimental transmittance spectrum with the theoretical one.The results revealed that the optical constants of theInxSeyfilms were significantly affected by the deposition method.

Date: 2002
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DOI: 10.1142/S0218625X02004220

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