THE HALL EFFECT IN HYDRIDED RARE EARTH FILMS: REMOVING BILAYER EFFECTS

D. W. Koon (), D. E. Azofeifa and N. Clark
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D. W. Koon: Physics Department, St. Lawrence University, Canton, NY 13617, USA
D. E. Azofeifa: CICIMA and Escuela de Física, Universidad de Costa Rica, San José, Costa Rica
N. Clark: CICIMA and Escuela de Física, Universidad de Costa Rica, San José, Costa Rica

Surface Review and Letters (SRL), 2002, vol. 09, issue 05n06, 1721-1724

Abstract: We describe two new techniques for measuring the Hall effect in capped rare earth films during hydriding. In one, we simultaneously measure resistivity and the Hall coefficient for a rare earth film covered with four different thicknesses of Pd, recovering the charge transport quantities for both materials. In the second technique, we replace Pd with Mn as the covering layer. We will present results from both techniques.

Date: 2002
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DOI: 10.1142/S0218625X02004281

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