SURFACE TOPOGRAPHY ON EPITAXIALHoBa2Cu3O7-δANDBi2Sr2CaCu2O8+δTHIN FILMS

W. Lopera (), D. Giratá, F. Pérez, L. F. Castro, E. Baca, P. Prieto and A. Mendoza
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W. Lopera: Instituto de Física, Universidad de Antioquia, A.A. 1226, Medellín, Colombia
D. Giratá: Instituto de Física, Universidad de Antioquia, A.A. 1226, Medellín, Colombia
F. Pérez: Departamento de Física, Universidad del Valle, A.A. 25360, Cali, Colombia
L. F. Castro: Departamento de Física, Universidad del Valle, A.A. 25360, Cali, Colombia
E. Baca: Departamento de Física, Universidad del Valle, A.A. 25360, Cali, Colombia
P. Prieto: Departamento de Física, Universidad del Valle, A.A. 25360, Cali, Colombia
A. Mendoza: Laboratorio de Optoelectrónica, Universidad del Quindío, A.A. 460, Armenia, Colombia

Surface Review and Letters (SRL), 2002, vol. 09, issue 05n06, 1729-1733

Abstract: Surface topography on epitaxialHoBa2Cu3O7-δ(HBCO) andBi2Sr2CaCu2O8+δ(BSCCO) thin films analysis by using the atomic force microscopy (AFM) technique was carried out. The films were depositedin situonSrTiO3substrates with thicknesses ranging from 100 to 300 nm by a high-pressure sputtering process. Chemical etching with a nonaqueous solution of Br-ethanol was used to modify the surface of the samples. HBCO films showed spiral grains, while BSCCO samples exhibited a terraced growth. Etching with Br-ethanol has different effects on HBCO and BSCCO. In HBCO, etching produces clean surfaces with light changes on the surface morphology, whereas in BSCCO it conduces to strong changes in the structure and the roughness of the film surface.

Date: 2002
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DOI: 10.1142/S0218625X0200430X

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