HOLOGRAPHIC ANALYSIS OF KIKUCHI ELECTRON DIFFRACTION DATA FROM${\rm Si}(111)(\sqrt{3}\times\sqrt{3}){\rm R}30^\circ{\rm -Al}$

G. S. Glander
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G. S. Glander: Physics Department, Stetson University, DeLand, FL 32723, USA

Surface Review and Letters (SRL), 2003, vol. 10, issue 01, 105-115

Abstract: Holographic analysis was applied to Kikuchi electron diffraction data collected from the${\rm Si}(111)(\sqrt{3}\times\sqrt{3}){\rm R}30^\circ{\rm -Al}$structure to produce real-space images of the surface structure. Methods for calibrating the initial diffraction data are fully described. The images clearly show features caused by the Al atoms in theT4absorption site. Measurements of the Al–Si bond length and the height of the Al above the top layer of Si agree with the values known from dynamical LEED studies.

Keywords: Kikuchi electron holography; direct imaging; holographic imaging; multiple-energy phase-summing method; low-energy Kikuchi electron pattern inversion; ${\rm Al/Si}(111)(\sqrt{3}\times\sqrt{3}){\rm R}30^\circ$surface; direct structural information; KEH; Al; Si; Si–Al (search for similar items in EconPapers)
Date: 2003
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DOI: 10.1142/S0218625X03004627

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