Structural Symmetry and Optical Properties of Dielectric Multilayers

R. W. Peng, X. Q. Huang, F. Qiu, Y. M. Liu, A. Hu and S. S. Jiang
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R. W. Peng: National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
X. Q. Huang: National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
F. Qiu: National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
Y. M. Liu: National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
A. Hu: National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
S. S. Jiang: National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China

Surface Review and Letters (SRL), 2003, vol. 10, issue 02n03, 311-315

Abstract: We have investigated the structural symmetry and optical properties of the dielectric multilayers. By using the transfer-matrix method, the propagation of electromagnetic wave in the dielectric multilayer film is obtained. It is shown that if a mirror symmetry is induced to the structure, perfect transmissions will definitely happen. And the perfect transmission can be controlled at certain wavelengths if the special structure with symmetry is achieved. Experimental observations are in good agreement with the theoretical predictions. This finding will have potential applications to optoelectric devices, such as the wavelength division multiplexing (WDM) system.

Date: 2003
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DOI: 10.1142/S0218625X03004950

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