Nanostructured Gold Thin Films: Young Modulus Measurement

M. C. Salvadori (), A. R. Vaz, L. L. Melo and M. Cattani
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M. C. Salvadori: Institute of Physics, University of São Paulo, CP 66318, CEP–05315-970, São Paulo, SP, Brazil
A. R. Vaz: Institute of Physics, University of São Paulo, CP 66318, CEP–05315-970, São Paulo, SP, Brazil
L. L. Melo: Institute of Physics, University of São Paulo, CP 66318, CEP–05315-970, São Paulo, SP, Brazil
M. Cattani: Institute of Physics, University of São Paulo, CP 66318, CEP–05315-970, São Paulo, SP, Brazil

Surface Review and Letters (SRL), 2003, vol. 10, issue 04, 571-575

Abstract: We have uniformly coated the cantilever of an atomic force microscope (AFM) with gold thin films. These films are nanostructured with thickness going from 19 to 62 nm. The resonance frequencies of this cantilever have been measured, before and after the Au coatings. Taking into account these frequencies and the vibrating beam theory, we determined the Young modulus of the Au films, obtainingE2= 69.1 ± 2.6GPa, i.e. about 12% lower than the respective bulk elastic modulus.

Keywords: Gold thin films; Young modulus; nanostructured material (search for similar items in EconPapers)
Date: 2003
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DOI: 10.1142/S0218625X03005323

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