SUPERSTRUCTURE FORMATION AND X-RAY PHOTOEMISSION PROPERTIES OF THETlTiOPO4SURFACE

V. V. Atuchin (), L. D. Pokrovsky, V. G. Kesler, N. Yu. Maklakova, V. I. Voronkova and V. K. Yanovskii
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V. V. Atuchin: Laboratory of Optical Materials and Structures, Institute of Semiconductor Physics, Novosibirsk, 630090, Russia
L. D. Pokrovsky: Laboratory of Optical Materials and Structures, Institute of Semiconductor Physics, Novosibirsk, 630090, Russia
V. G. Kesler: Technical Centre, Institute of Semiconductor Physics, Novosibirsk, 630090, Russia
N. Yu. Maklakova: Laboratory of Crystal Growth, Institute of Mineralogy and Petrography, Novosibirsk, 630090, Russia
V. I. Voronkova: Department of Physics, Moscow State University, Moscow, 117234, Russia
V. K. Yanovskii: Department of Physics, Moscow State University, Moscow, 117234, Russia

Surface Review and Letters (SRL), 2004, vol. 11, issue 02, 191-198

Abstract: X-ray photoemission spectroscopy (XPS) measurements have been executed forTlTiOPO4to elucidate the general features in the electronic structure of theKTiOPO4family compounds. The peculiarities of the valence band structure have been discussed for the crystals. The persistence of core level binding energy differencesO1s–P2pandO1s–Ti2p3/2has been detected inTlTiOPO4andKTiOPO4, which relates well with the constancy of averagedP–OandTi–Ochemical bond lengths in this crystal family. The superstructure ordering of theTlTiOPO4surface subjected to polishing and annealing has been detected by reflectance high energy electron diffraction (RHEED). From comparison of surface crystallographic properties ofTlTiOPO4andKTiOPO4, the most typical superstructure indices have been revealed.

Keywords: Thallium titanyl phosphate; RHEED; XPS; surface; superstructure; electronic structure; 42.70.Mp; 61.14.Hg; 82.80.Pv (search for similar items in EconPapers)
Date: 2004
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DOI: 10.1142/S0218625X04006013

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