DETERMINATION OF THICKNESS OF HYDRATION LAYERS ON MICA IN AQUEOUS SOLUTIONS BY USING AFM

Changsheng Peng () and Shaoxian Song
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Changsheng Peng: Instituto de Metalurgia, Universidad Autónoma de San Luis Potosí, Av. Sierra Leona 550, San Luis Potosí, C. P. 78210, México
Shaoxian Song: Instituto de Metalurgia, Universidad Autónoma de San Luis Potosí, Av. Sierra Leona 550, San Luis Potosí, C. P. 78210, México

Surface Review and Letters (SRL), 2004, vol. 11, issue 06, 485-489

Abstract: We present an experimental technique to determine the thickness of hydration layers on solid surfaces in aqueous solutions by using an atomic force microscope (AFM). This technique is based on the phenomenon where a small line bending in the AFM force–distance plot of hydrated solid surface in aqueous solutions, may be due to the existence of hydration layers on the tip and the solid surface. The thickness of hydration layers on mica plate immersed in water andNaClsolutions were determined with this technique.

Keywords: Hydration layer; thickness; atomic force microscope; force–distance plot; mica (search for similar items in EconPapers)
Date: 2004
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DOI: 10.1142/S0218625X04006475

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