DEFECT CONCENTRATION IN DEFORMEDAlSiMgSrBY TRAPPING MODEL OF POSITRON

M. A. Abdel-Rahman, M. S. Abdallah and Emad A. Badawi ()
Additional contact information
M. A. Abdel-Rahman: Physics Department, Faculty of Science, El-Minia University, Egypt
M. S. Abdallah: Physics Department, Faculty of Science, El-Minia University, Egypt
Emad A. Badawi: Physics Department, Faculty of Science, El-Minia University, Egypt

Surface Review and Letters (SRL), 2005, vol. 12, issue 04, 545-547

Abstract: This paper reports the results of lifetime measurements on deformedAlSiMgSralloy. Using the trapping model, we obtained the value of 196.7 ps for the lifetime of the free state, and 210.5 ps for the trapped state. The specific trapping rate per unit defect concentration was calculated to be 0.2280 cm2· s-1. The concentration of defects was5.78×1017cm-3when thickness reduction was 18.2%. The dislocation density for the same thickness reduction is1.63×1010cm-2. We have compared these values with a previously used method1and have obtained perfect agreement for both methods, demonstrating that this a very powerful tool for detecting and evaluating defect concentration.

Keywords: Positron annihilation; trapping model; specific trapping rate (search for similar items in EconPapers)
Date: 2005
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X05007396
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:12:y:2005:i:04:n:s0218625x05007396

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X05007396

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().