SCANNING ELECTRON MICROSCOPE AND X-RAY DIFFRACTION STUDIES ON THE LATTICE CONSTANT OF SPIN-COATEDZn1-xMgxOTHIN FILMS OF SOL-GEL METHOD

M. Rusop (), K. Uma, T. Soga and T. Jimbo
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M. Rusop: Department of Environment Technology and Urban Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan
K. Uma: Department of Environment Technology and Urban Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan
T. Soga: Department of Environment Technology and Urban Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan
T. Jimbo: Department of Environment Technology and Urban Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan;

Surface Review and Letters (SRL), 2005, vol. 12, issue 04, 605-610

Abstract: ZnOandZn1-xMgxOthin films were prepared on glass and silicon substrates by spin coating method using 2-methoxyethanol solution of zinc acetate dihydrate and magnesium acetate dihydrate stabilized by monoethanolamine. The effects of drying and annealing condition of structural and optical properties of the films were studied. It was found that the samples annealed at 650°C improves the crystallographic orientation of theZnOfilms grown by the sol-gel process significantly. Two types of substrates were used to examine the substrate effects of the growth ofZn1-xMgxOthin films. In corning glass substrates, the lattice constant decreased by a little with increasing concentration ofMg, whereas in the case of silicon substrates, the lattice constant decreased rapidly withxwhen compared to the glass substrates. The optical band energy gaps ofZn1-xMgxOthin films were slightly increased with increasing concentration ofMg.

Keywords: Sol-gel; zinc oxide; X-ray diffraction; lattice constant; Zn1-xMgxO; spin-coating (search for similar items in EconPapers)
Date: 2005
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DOI: 10.1142/S0218625X05007499

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