KINETIC SURFACE ROUGHENING OF PLATINUM AND GOLD THIN FILMS

M. Cattani () and M. C. Salvadori
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M. Cattani: Instituto de Física, Universidade de São Paulo, C. P. 66318, CEP 05315-970, São Paulo, SP, Brazil
M. C. Salvadori: Instituto de Física, Universidade de São Paulo, C. P. 66318, CEP 05315-970, São Paulo, SP, Brazil

Surface Review and Letters (SRL), 2005, vol. 12, issue 05n06, 675-679

Abstract: Platinum and gold thin films have been fabricated by filtered vacuum arc deposition perpendicularly on rough silicon and glass substrates. Four sets of samples have been prepared with different thickness(d). Two sets were very thin films ofPt(1.31 ≤ d ≤ 11.66nm)andAu(1.77 ≤ d ≤ 10.46nm)and two sets were thicker films also ofPt(7 ≤ d ≤ 80nm)andAu(34 ≤ d ≤ 200nm). The roughness mean-square ω of the films have been measured, as a function of the film thicknessd, by scanning tunneling microscopy (STM). We verified that the dynamical scaling relationω(t) ~ tβ, where β is the growth exponent, is obeyed for the thicker films but it is not obeyed for the very thin films. These cases are analyzed taking into account the films growth theory.

Keywords: Surface roughness of metallic thin films; dynamical scaling relations (search for similar items in EconPapers)
Date: 2005
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DOI: 10.1142/S0218625X05007645

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