STRUCTURE AND CHARACTERIZATION OFZnOTHIN FILM PREPARED BY SPIN COATING

Guangpeng Ma, Jianru Han (), Changhong Yang, Hongyan Xu, Dongmei Yang, Shengli Gu and Fiyi Jiang
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Guangpeng Ma: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China
Jianru Han: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China
Changhong Yang: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China
Hongyan Xu: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China
Dongmei Yang: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China
Shengli Gu: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China
Fiyi Jiang: State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, P. R. China

Surface Review and Letters (SRL), 2006, vol. 13, issue 01, 13-15

Abstract: ZnOthin films were prepared on silica glass substrates by a sol–gel spin coating technique. The thickness of the films was about 200 nm. At 370 nm in the ultraviolet region, there is a sharp absorption edge that corresponds to theZnOintrinsic band gap of 3.30 eV. The structural properties of the films were examined by X-ray diffraction, which demonstrates that theZnOfilms werec-axis oriented. From the infrared spectrum, we conclude thatZnOwas deposited on silica glass substrates through a high temperature process at 700°C.

Keywords: Zinc oxide thin films; spin coating; sol–gel method; optical transmission (search for similar items in EconPapers)
Date: 2006
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DOI: 10.1142/S0218625X06007779

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