HETEROEPITAXIAL GROWTH OF STRESS FREE SINGLE CRYSTAL PEROVSKITE THIN FILMS

K. Wasa, S. H. Seo, D. Y. Noh, I. Kanno and T. Suzuki
Additional contact information
K. Wasa: Faculty of Science, Yokohama City University, Yokohama, Japan
S. H. Seo: Kwangju Institute of Science and Technology, Kwangju, 506-712, Korea
D. Y. Noh: Kwangju Institute of Science and Technology, Kwangju, 506-712, Korea
I. Kanno: Department of Mechanical Engineering, Kyoto University, Kyoto, Japan
T. Suzuki: Department of Mechanical Engineering, Kyoto University, Kyoto, Japan

Surface Review and Letters (SRL), 2006, vol. 13, issue 02n03, 167-172

Abstract: Thin films of singlec-domain/single crystal(PbMg1/3Nb2/3O3)1-x(PbTiO3)x,x = 0–0.4(PMNT) were heteroepitaxially grown on(001)SrTiO3and(001)MgOsubstrates by magnetron sputtering using a quenching process. The lattice parameters of the quenched PMNT thin films were almost the same to the bulk values independently to the lattice parameters of substrates. The quenched PMNT thin films showed stress free structural properties, although the crystal structure of thin films is modified from bulk PMNT. The electromechanical properties are the same to the bulk singlec-domain single crystals.

Keywords: Thin films; PMN-PT; single crystal; stress free; piezoelectricity (search for similar items in EconPapers)
Date: 2006
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X06008189
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:13:y:2006:i:02n03:n:s0218625x06008189

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X06008189

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().