INCOMMENSURATE METALLIC SURFACTANT LAYER ON TOP OFInNFILM

Y. Liu, J. Wang, M. H. Xie and H. S. Wu
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Y. Liu: Department of Physics and HKU-CAS Joint Laboratory on New Materials, The University of Hong Kong, Pokfulam Road, Hong Kong, China
J. Wang: Department of Physics and HKU-CAS Joint Laboratory on New Materials, The University of Hong Kong, Pokfulam Road, Hong Kong, China
M. H. Xie: Department of Physics and HKU-CAS Joint Laboratory on New Materials, The University of Hong Kong, Pokfulam Road, Hong Kong, China
H. S. Wu: Department of Physics and HKU-CAS Joint Laboratory on New Materials, The University of Hong Kong, Pokfulam Road, Hong Kong, China

Surface Review and Letters (SRL), 2006, vol. 13, issue 06, 815-818

Abstract: The surface structure ofInNfilm heteroepitaxially grown on aGaNbuffer layer by MBE is followed by low energy electron diffraction (LEED). The metallic surfactant layers on top of theInNsurfaces show an incommensurate structure rather than being disordered. The metal in the incommensurate structure induces additional diffraction spots in the LEED. Based on the Auger experiments, not onlyInatoms but alsoGaare present on the surface of theInNfilms.

Date: 2006
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DOI: 10.1142/S0218625X06008967

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