STRUCTURE CONTROL AND FERROELECTRIC PROPERTIES OFSrBi4Ti4O15THIN FILMS ONSiSUBSTRATES COATED BY (100)- AND (110)-ORIENTEDLaNiO3ELECTRODES

Pilong Wang, Guangda Hu (), Yanxia Ding and Suhua Fan
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Pilong Wang: School of Materials Science and Engineering, University of Jinan, Jinan 250022, China
Guangda Hu: School of Materials Science and Engineering, University of Jinan, Jinan 250022, China
Yanxia Ding: School of Materials Science and Engineering, University of Jinan, Jinan 250022, China
Suhua Fan: College of Materials Science and Engineering, Shandong Jianzhu University, 250101, China

Surface Review and Letters (SRL), 2007, vol. 14, issue 03, 435-438

Abstract: SrBi4Ti4O15(SBTi)thin films were prepared on (100)- and (110)-orientedLaNiO3(LNO)electrodes by a metalorgranic decomposition (MOD) technique at an annealing temperature of 650°C.c-axis-orientedSBTithin film with volume fraction of 0.89 can be formed on a (100)-orientedLNOfilm due to the epitaxial relationship betweenc-axis-orientedSBTiandLNO(100). In contrast,SBTifilm deposited onLNO(110)shows random orientations with strong (119) and (200) peaks. The remanent polarization(Pr)and coercive field(Ec)of the random orientedSBTifilm were 18.1 μC/cm2and 70 kV/cm, respectively. This suggests that (110)-orientedLNOelectrode is a better choice for obtainingSBTifilms with higher volume fraction ofa(b)-axis-orientated grains.

Keywords: SrBi4Ti4O15thin film; LaNiO3thin film; metalorganic decomposition; epitaxial growth (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1142/S0218625X07009554

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