EFFECTS OF ANNEALING ANDArINTERCALATION ON GLASS TRANSITION INC60FILMS

Jian Wu, Min Gu (), Lili Zhang, Yao Yu, Xin Chen and Tong B. Tang
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Jian Wu: National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China
Min Gu: National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China
Lili Zhang: National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China
Yao Yu: National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China
Xin Chen: National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China
Tong B. Tang: Department of Physics, Hong Kong Baptist University, Kowloon, Hong Kong SAR, P. R. China

Surface Review and Letters (SRL), 2007, vol. 14, issue 04, 601-606

Abstract: C60films were fabricated by vacuum sublimation and studied with dielectric spectroscopy regarding glass transition. With annealing, the dielectric loss peaks decreased in height, and the apparent activation energy deduced from their frequency dependence dropped in magnitude. The peaks, broad and asymmetrical, were fitted with Ngai's correlated-states model. The calculated value of the correlation constant β increased after annealing, which may be explained by the reduction in extrinsic dipole density. Some annealed films were further charged withArunder high pressure, and found to have suppressed transition temperature and activation energy, attributable to the negative pressure effect of intercalation. Freshly charged films exhibited a feature near 137 K in their impedance spectra, probably due to domains of exceptionally highArconcentration.

Keywords: C60film; glass transition; annealing; Arintercalation (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1142/S0218625X0700975X

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