THE STRUCTURE AND TRANSPORT PROPERTIES OFLa0.9Sr0.1MnO3

Z. Luo and J. Gao ()
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Z. Luo: Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, People's Republic of China
J. Gao: Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, People's Republic of China

Surface Review and Letters (SRL), 2007, vol. 14, issue 04, 813-816

Abstract: Thin films ofLa0.9Sr0.1MnO3(LSMO) were grown onSrTiO3substrate by pulsed laser deposition technique at different temperatures and with various oxygen partial pressures. X-ray diffraction spectra confirmed that the grown films are of single phase. The influence of oxygen deficiency on the structure of these grown films has been studied. X-ray diffraction data suggested that higher oxygen content generally results in smaller out-of- plane lattice parameters and annealing in oxygen may further decrease the lattice parameters. The 2-θ value increases with oxygen pressure. Typically, the oxygen-deficient films behave like semiconductors. For films grown at the same temperature, the conductivity is enhanced if the oxygen content is increased. Those films grown in 1 mbar oxygen partial pressure show an upturn at low temperature. Resistivity is dominated by the hopping of adiabatic small polarons at high temperature.

Keywords: Thin film; CMR; La0.9Sr0.1MnO3 (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1142/S0218625X07010299

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