SURFACE MORPHOLOGY AND PHOTOLUMINESCENCE CHARACTERISTICS OFSm-DOPEDYVO4THIN FILMS

Hyun Kyoung Yang, Jong Won Chung, Byung Kee Moon, Byung Chun Choi, Jung Hyun Jung (), Soung Soo Yi, Jung Hwan Kim and Kwang Ho Kim
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Hyun Kyoung Yang: Department of Physics, Pukyong National University, Busan 608-737, Republic of Korea
Jong Won Chung: Department of Physics, Pukyong National University, Busan 608-737, Republic of Korea
Byung Kee Moon: Department of Physics, Pukyong National University, Busan 608-737, Republic of Korea
Byung Chun Choi: Department of Physics, Pukyong National University, Busan 608-737, Republic of Korea
Jung Hyun Jung: Department of Physics, Pukyong National University, Busan 608-737, Republic of Korea
Soung Soo Yi: Department of Electronic Material Engineering, Silla University, Busan 617-736, Republic of Korea
Jung Hwan Kim: Department of Physics, Dong Eui University, Busan 614-714, Republic of Korea
Kwang Ho Kim: School of Materials Science and Engineering, Busan National University, Busan 609-735, Republic of Korea

Surface Review and Letters (SRL), 2007, vol. 14, issue 05, 873-878

Abstract: Surface morphology and crystallinity ofYVO4:Sm3+thin films have an influence on the photoluminescence characteristics. TheYVO4:Sm3+films have been deposited onAl2O3(0001) substrates using pulsed laser deposition method. The films were grown at the various substrate temperatures changing from 500 to 700°C. The crystallinity and surface morphology of the films were investigated using X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. The results of XRD showed thatYVO4:Sm3+films had a zircon structure and AFM study revealed that the films consisted of homogeneous grains ranging from 100 to 400 nm depending on the deposition conditions. The photoluminescence spectra were measured at room temperature and the emitted radiation was dominated by the red emission peak at 620 nm radiated from the transition of5D0-7F2. The crystallinity, surface morphology, and photoluminescence spectra of thin-film phosphors were highly dependent on the substrate temperature. The surface roughness and photoluminescence intensity of the films showed similar behavior as a function of substrate temperature.

Keywords: YVO4:Sm3+; thin-film phosphors; surface morphology; photoluminescence (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1142/S0218625X07010548

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