LOW-TEMPERATURE SYNTHESIZEDZnONANONEEDLES: XPS AND PL ANALYSIS

Dongseok Park, Youngjo Tak, Jaehyun Kim and Kijung Yong ()
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Dongseok Park: Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea
Youngjo Tak: Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea
Jaehyun Kim: Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea
Kijung Yong: Surface Chemistry Laboratory of Electronic Materials, Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea

Surface Review and Letters (SRL), 2007, vol. 14, issue 06, 1061-1065

Abstract: Evolution of morphology change was investigated forZnOnanoneedle array grown by low-temperature MOCVD. Well-alignedZnOnanoneedle array was deposited on theZnObuffer-film/Sisubstrate at temperatures below 500°C. A rod-shapedZnOnanowire in the initial growth stage changed into needle-shaped as the deposition proceeds.ZnOnanoneedle array deposited on the annealed buffer-film showed better alignment compared to that deposited on the as-grown film. XPS analysis showed thatZn2p peak has a single binding energy state of a stoichiometricZn–Obond whileO1 s peak has three different chemical binding states. Highly crystallineZnOnanoneedle array showed a strong bandedge emission at 380 nm in photoluminescence measurements.

Keywords: ZnOnanoneedle; photoluminescence; MOCVD; XPS (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1142/S0218625X07010639

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