EFFECTS OF SPUTTEREDArPRESSURE AND SUBSTRATE TEMPERATURE ON THE MICROSTRUCTURE AND MAGNETIC PROPERTIES OFCr/SmCo5/CrFILMS

Congmian Zhen (), Jinjuan Zhang, Li Ma, Denglu Hou, Ying Liu and Shiqiang Li
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Congmian Zhen: College of Physics Science and Information Engineering, Hebei Normal University, Hebei Shijiazhuang 050016, China
Jinjuan Zhang: College of Physics Science and Information Engineering, Hebei Normal University, Hebei Shijiazhuang 050016, China
Li Ma: College of Physics Science and Information Engineering, Hebei Normal University, Hebei Shijiazhuang 050016, China
Denglu Hou: College of Physics Science and Information Engineering, Hebei Normal University, Hebei Shijiazhuang 050016, China
Ying Liu: College of Physics Science and Information Engineering, Hebei Normal University, Hebei Shijiazhuang 050016, China
Shiqiang Li: Department of Physics, College of Science, Hebei University of Science and Technology, Hebei shijiazhuang 050018, China

Surface Review and Letters (SRL), 2008, vol. 15, issue 01n02, 105-109

Abstract: Cr/SmCo5/Crfilms were fabricated by a DC facing targets magnetron sputtering. The influences of sputteredArpressure and substrate temperature on their microstructure and magnetic properties were investigated. Magnetic measurements indicate that the optimal substrate temperature was 450°C, and the film deposited at 2 PaArpressure had the largest in-plane coercivity (2403.54 Oe). NoSmCo5diffraction peaks exceptCr(110) peak with body-centered-cubic structure were seen in all the samples by X-ray diffusion. The Needle-like grains of the film deposited at lowArpressure were observed by atomic force microscope. The domain pattern of the film fabricated at 2 PaArpressure showed more uniform. When the sputteredArpressure was 2 Pa, the narrowest switching field distribution (0.57) was obtained, indicating a narrower grain size distribution. TheδMvalue was nearly zero for the film deposited at 2 PaArpressure, and this indicated that there was almost noninteraction between grains.

Keywords: SputteredArpressure; magnetic measurements; atomic force microscopy; longitudinal magnetic recording (search for similar items in EconPapers)
Date: 2008
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DOI: 10.1142/S0218625X08011056

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