FIELD-ION MICROSCOPY OBSERVATIONS AND ATOMISTIC SIMULATIONS OF RIGID-BODY SHIFTS AT TILT GRAIN BOUNDARIES IN TUNGSTEN

V. M. Azhazha, I. M. Neklyudov, V. A. Ksenofontov, T. I. Mazilova, I. M. Mikhailovskij (), E. V. Sadanov and A. A. Mazilov
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V. M. Azhazha: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine
I. M. Neklyudov: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine
V. A. Ksenofontov: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine
T. I. Mazilova: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine
I. M. Mikhailovskij: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine
E. V. Sadanov: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine
A. A. Mazilov: National Scientific Centre, Kharkov Institute of Physics and Technology, Academicheskaja 1, 61108 Kharkov, Ukraine

Surface Review and Letters (SRL), 2008, vol. 15, issue 05, 557-565

Abstract: Field-ion microscopy and molecular dynamics simulation were used for the characterization of the translation states at special grain boundaries in tungsten. It is revealed that rigid-body displacement had the component of displacement parallel to the [110] direction equal to 0 or 1 interplanar spacing. Full vectors of lateral shifts are described by broad statistical distribution. The mathematical simulation revealed two mirror-symmetry-breaking lateral translations along the$[{\bar{2}21}]$direction of the Σ9 grain boundary corresponding to different atomic structures. It is shown that the partial disconnection with the$(a/18)[{\bar{2}21}]$Burgers vector can be considered as the elemental carriers of grain-boundary polymorphic transformation.

Keywords: Grain boundary; atomic structure; tungsten; molecular dynamic simulation; field-ion microscopy (search for similar items in EconPapers)
Date: 2008
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DOI: 10.1142/S0218625X08011767

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