LOW FREQUENCY ACOUSTIC RESPONSE OF SURFACE CRACKS BY ATOM FORCE ACOUSTIC MICROSCOPY

Wei-Tao Su (), Bin Li, Ding-Quan Liu and Feng-Shan Zhang
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Wei-Tao Su: Institute of Material Physics, Hangzhou Dianzi University, Hangzhou 310018, China
Bin Li: Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
Ding-Quan Liu: Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
Feng-Shan Zhang: Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

Surface Review and Letters (SRL), 2009, vol. 16, issue 03, 449-453

Abstract: Surface crack ofCeF3films generated by thermal stress were characterized by scanning electron microscopy and atom force acoustic microscopy (AFAM). Low frequency (8–18 kHz) acoustic response of films and cracks was measured by AFAM. The low frequency acoustic response is similar to what had been got at several MHz or even higher frequency. It was found that surface elastic properties ofCeF3films can be easily qualitatively measured by low frequency AFAM.

Keywords: CeF3films; low frequency AFAM; surface cracks (search for similar items in EconPapers)
Date: 2009
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DOI: 10.1142/S0218625X09012846

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