WAVE OPTICAL TREATMENT OF SURFACE STEP CONTRAST IN LOW-ENERGY ELECTRON MICROSCOPY

S. M. Kennedy, N. E. Schofield, D. M. Paganin and D. E. Jesson ()
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S. M. Kennedy: School of Physics, Monash University, Victoria 3800, Australia
N. E. Schofield: School of Physics, Monash University, Victoria 3800, Australia
D. M. Paganin: School of Physics, Monash University, Victoria 3800, Australia
D. E. Jesson: School of Physics, Monash University, Victoria 3800, Australia

Surface Review and Letters (SRL), 2009, vol. 16, issue 06, 855-867

Abstract: A wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) is presented. The aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface steps are evaluated in one and two dimensions. Under the special circumstances of a weak phase object, the simplified form of the contrast transfer function (CTF) is used to discuss LEEM image contrast and optimum defocus conditions.

Keywords: Contrast transfer function; low-energy electron microscopy (LEEM); phase contrast imaging; surface steps (search for similar items in EconPapers)
Date: 2009
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DOI: 10.1142/S0218625X09013402

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