OPTICAL PROPERTIES OFAsSeTlTHIN FILMS DEPOSITED BYe-BEAM EVAPORATION TECHNIQUE

M. M. Abd El-Raheem ()
Additional contact information
M. M. Abd El-Raheem: Department of Physics, Faculty of Science, Taif University, Taif 888, Saudi Arabia

Surface Review and Letters (SRL), 2011, vol. 18, issue 01n02, 71-75

Abstract: Five compositions of the systemAs25Se75-xTlx(x = 12, 16, 20, 24 and 28%) have been prepared using melt quench technique. Thin films of the same thickness (200 nm) were deposited by electron beam evaporation technique. Optical and other parameters of the films have been studied. The optical band gapEopfound to decrease by increasing the coordination numberrand average number of bonds per atomNavand by decreasing the heat of atomizationHs. Other parameters as an oscillator energyEo, dispersion energyEdand plasma frequencyωpfound to be affected by changing thallium content.

Keywords: Optical gap; coordination number; heat of atomization; dispersion energy; plasma frequency (search for similar items in EconPapers)
Date: 2011
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X11014394
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:18:y:2011:i:01n02:n:s0218625x11014394

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X11014394

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().