GROWTH AND STABILITY OF ULTRA-THINPbFILMS ONPb/Si(111)-α-√3 × √3

Wen-Juan Li, Yu-Jie Sun, Xie-Gang Zhu, Guang Wang, Yan-Feng Zhang, Jin-Feng Jia, Xucun Ma, Xi Chen and Qi-Kun Xue
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Wen-Juan Li: Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, P. R. China
Yu-Jie Sun: State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084, P. R. China
Xie-Gang Zhu: State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084, P. R. China
Guang Wang: State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084, P. R. China
Yan-Feng Zhang: Academy for Advanced Materials and Nanotechnology, College of Engineering, Peking University, Beijing 100871, P. R. China
Jin-Feng Jia: State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084, P. R. China;
Xucun Ma: Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, P. R. China
Xi Chen: State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084, P. R. China
Qi-Kun Xue: Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, P. R. China;

Surface Review and Letters (SRL), 2011, vol. 18, issue 01n02, 77-82

Abstract: Ultra-thinPbfilms with magic thicknesses of 2 monolayer (ML), 4 ML and 6 ML were prepared of atomically flat on the substrate ofSi(111)-α-√3 × √3(or SIC phase) at 145 K. Their surface morphologies and stability were studied by low temperature scanning tunneling microscopy and temperature-dependent angle resolved photoemission spectroscopy. We found that the well ordered SIC interface can lower the diffusion barrier and enhance the interface charge transfer, leading to different critical thickness compared toPb/Si(111)-7 × 7grown under same conditions. Enhanced thermal expansion coefficients were also observed in ultra-thinPbfilms at low temperature.

Keywords: Pbfilms; stability; STM; ARPES (search for similar items in EconPapers)
Date: 2011
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DOI: 10.1142/S0218625X11014473

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