BUFFER LAYER EFFECTS ON MAGNETOELECTRIC COUPLING OFNi/Pb(Zr0.52Ti0.48)O3BILAYERS
K. Bi,
Z. L. He and
Y. G. Wang ()
Additional contact information
K. Bi: College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, P. R. China
Z. L. He: College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, P. R. China
Y. G. Wang: College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, P. R. China
Surface Review and Letters (SRL), 2011, vol. 18, issue 05, 177-181
Abstract:
Magnetoelectric (ME)Ni/Pb(Zr0.52Ti0.48)O3bilayers have been successfully prepared by hydrothermal method usingTias buffer layer. The hydrothermal mechanism of PZT thin film deposited ontoNilayer has been discussed. The structure and ferroelectric properties of the deposited PZT thin films are characterized by X-ray diffraction and ferroelectric testing. The ME voltage coefficient of theNi/PZT bilayers gradually decreases as the thickness of buffer layer increases because the interface coupling of theNi/PZT layers gradually decreases. The large ME coefficient makes theseNi/PZT bilayers possible for applications in multifunctional devices such as electromagnetic sensor, transducers and microwave devices.
Keywords: Magnetoelectric; buffer layer; hydrothermal method (search for similar items in EconPapers)
Date: 2011
References: View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X11014631
Access to full text is restricted to subscribers
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:18:y:2011:i:05:n:s0218625x11014631
Ordering information: This journal article can be ordered from
DOI: 10.1142/S0218625X11014631
Access Statistics for this article
Surface Review and Letters (SRL) is currently edited by S Y Tong
More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().