POLARIZATION FATIGUE BEHAVIORS INBi3.5Nd0.5Ti3O12FERROELECTRIC THIN FILMS

C. P. Cheng (), B. Jiang (), M. H. Tang (), G. Y. Wang (), S. B. Yang () and H. Y. Xu ()
Additional contact information
C. P. Cheng: Faculty of Science, Hunan Institute of Engineering, Xiangtan, Hunan, 411105, China
B. Jiang: Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China
M. H. Tang: Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China
G. Y. Wang: Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China
S. B. Yang: Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China
H. Y. Xu: Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China

Surface Review and Letters (SRL), 2011, vol. 18, issue 05, 203-208

Abstract: The evolution of the fatigue behaviors inBi3.5Nd0.5Ti3O12(BNT) ferroelectric thin films deposited onPt(111)/Ti/SiO2/Si(100)substrates by chemical solution deposition (CSD) method effected by amplitude, frequency and profile of the driving electric field were reported. It is found that the switching with lower frequency and higher amplitude of the external voltages resulted in higher fatigue rates and only bipolar waveform type voltage can result in fatigue, whereas a unipolar voltage cannot. An empirical function withN/fis proposed in the frequency-dependence of polarization fatigue, whereNis the number of switching cycles andfis the frequency of driving. It is indicated that injected charges from electrodes into films, the trapped charges, and suppression of the seeds of opposite domain nucleation are the main mechanism of fatigue in ferroelectric BNT thin films.

Keywords: BNT ferroelectric thin films; fatigue behavior; chemical solution deposition (search for similar items in EconPapers)
Date: 2011
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X11014680
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:18:y:2011:i:05:n:s0218625x11014680

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X11014680

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().