INTERFERENCE IN FAR-FIELD RADIATION OF EVANESCENT FIELDS
R. Cortes (),
V. Coello,
P. Segovia,
C. García,
J. M. Merlo and
J. F. Aguilar
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R. Cortes: Centro de Investigación Científica y de Educación Superior de Ensenada, CICESE, Unidad Monterrey, Alianza Sur 203, Autopista al Aeropuerto Km 10, Parque PIIT, Apodaca, N. L., C. P. 66600, México
V. Coello: Centro de Investigación Científica y de Educación Superior de Ensenada, CICESE, Unidad Monterrey, Alianza Sur 203, Autopista al Aeropuerto Km 10, Parque PIIT, Apodaca, N. L., C. P. 66600, México
P. Segovia: Doctorado en Ingeniería Física Industrial, Facultad de Ciencias Físico-Matemáticas, UANL, Pedro de Alba S/N Ciudad Universitaria, San Nicolás de los Garza, N. L., C. P. 66451, México
C. García: Doctorado en Ingeniería Física Industrial, Facultad de Ciencias Físico-Matemáticas, UANL, Pedro de Alba S/N Ciudad Universitaria, San Nicolás de los Garza, N. L., C. P. 66451, México
J. M. Merlo: Tecnológico de Monterrey, Campus Puebla, Vía Atlixcayotl 2301, San Andrés Cholula, Puebla, C. P. 72800, México
J. F. Aguilar: Instituto Nacional de Astrofísica Óptica y Electrónica, Luis Enrique Erro No. 1, Sta. Ma. Tonantzintla, Puebla, C. P. 72800, México
Surface Review and Letters (SRL), 2011, vol. 18, issue 06, 261-265
Abstract:
We investigate experimentally the interference in far-field radiation of two contra-propagating evanescent fields using a conventional optical microscope. A laser beam illuminates a glass-air interface under total internal reflection condition and through the proper setup a double evanescent illumination was produced. The evanescent fields radiate from the surface into the far-field domain due to small surface scatterers. Thus, coherent interference is produced in the far-field region which is correlated with the relative positions of the evanescent illumination sources. Finally, the above-described could be considered as a device for high accuracy micro-scale measurements as well as a direct visualization method of evanescent phenomena.
Keywords: Evanescent waves; optical interference; optical microscopy (search for similar items in EconPapers)
Date: 2011
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Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:18:y:2011:i:06:n:s0218625x11014746
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DOI: 10.1142/S0218625X11014746
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