EDAX SPECTRA AS A TOOL TO EVALUATE STRUCTURAL, COMPOSITIONAL AND ELECTRICAL PARAMETERS

B. Kavitha () and M. Dhanam
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B. Kavitha: PG and Research, Department of Physics, Kongunadu Arts and Science College, Coimbatore-641029, India
M. Dhanam: PG and Research, Department of Physics, Kongunadu Arts and Science College, Coimbatore-641029, India

Surface Review and Letters (SRL), 2012, vol. 19, issue 03, 1-7

Abstract: Near-stoichiometric and stoichiometricCu(InAl)Se2(CIAS) thin films have been prepared by successive ionic layer adsorption and reaction (SILAR) onto well-cleaned substrates. energy dispersive X-ray analysis (EDAX) spectra of the prepared thin films enabled to determine the film composition, stoichiometry nature, type of conductivity, lattice constants, volume of the unit cell and density of CIAS thin films. The estimated compositional, structural and electrical parameters are presented and discussed in this paper in detail.

Keywords: SILAR; stoichiometric CIAS; near stoichiometric CIAS; EDAX (search for similar items in EconPapers)
Date: 2012
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DOI: 10.1142/S0218625X12500266

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