EFFECT OFMgOON STRUCTURE AND DIELECTRIC PROPERTIES OFCaO–Al2O3–B2O3–SiO2GLASSES

Zhao Du, Xuehong Zhang, Yunlong Yue () and Haitao Wu
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Zhao Du: School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China
Xuehong Zhang: School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China
Yunlong Yue: School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China
Haitao Wu: School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China

Surface Review and Letters (SRL), 2012, vol. 19, issue 06, 1-4

Abstract: The effect ofMgOon structure and dielectric properties of aluminoborosilicate glasses was investigated. FTIR data indicated that glass network was mainly built by tetrahedral[SiO4],[BO4],[AlO4]and trigonal[BO3]. A small amount ofAlO5orAlO6units also existed. The glass system was characterized with lower dielectric constant (4.17 ~ 4.6) and dielectric loss (12.3 × 10-4~ 14.77 × 10-4) at 1 MHz. With the increase ofMgOcontent, the quantity ofAlO5orAlO6units decreased. The variation of density showed a decreasing tendency. The dielectric constant and loss were all found to decrease.

Keywords: Aluminoborosilicate; MgO; dielectric properties (search for similar items in EconPapers)
Date: 2012
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DOI: 10.1142/S0218625X12500631

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