MODULATIONS IN LOW-TEMPERATURE TRANSIENT REFLECTIVITY MEASUREMENTS

Salahuddin Khan (), Rama Chari, J. Jayabalan, Suparna Pal, T. K. Sharma, A. K. Sagar, M. S. Ansari and P. K. Kush
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Salahuddin Khan: Laser Physics Applications Section, Raja Ramanna Centre for Advanced Technology, Indore, India
Rama Chari: Laser Physics Applications Section, Raja Ramanna Centre for Advanced Technology, Indore, India
J. Jayabalan: Laser Physics Applications Section, Raja Ramanna Centre for Advanced Technology, Indore, India
Suparna Pal: Solid State Laser Division, Raja Ramanna Centre for Advanced Technology, Indore, India
T. K. Sharma: Solid State Laser Division, Raja Ramanna Centre for Advanced Technology, Indore, India
A. K. Sagar: Cryo-Engineering and Cryo-Module Development Section, Raja Ramanna Centre for Advanced Technology, Indore, India
M. S. Ansari: Cryo-Engineering and Cryo-Module Development Section, Raja Ramanna Centre for Advanced Technology, Indore, India
P. K. Kush: Cryo-Engineering and Cryo-Module Development Section, Raja Ramanna Centre for Advanced Technology, Indore, India

Surface Review and Letters (SRL), 2014, vol. 21, issue 01, 1-7

Abstract: Periodic modulations that appear in the low-temperature transient reflectivity signal of aGaAsP/AlGaAssingle quantum well is studied. Similar anomalous oscillations are also reported in layered manganite [K. Kouyamaet al.,J. Phys. Soc. Jpn.76(2007) 123702(1–3).] We show that such periodic modulations are caused by changes in the linear reflectivity of the sample during transient reflectivity measurements. Studies carried out on reflectivity of different materials under identical conditions show that these modulations on the true transient reflectivity signal are caused by condensation of residual gases on the surface of quantum well. Methods to obtain reliable transient reflectivity data are also described.

Keywords: Transient spectroscopy; carrier dynamics; reflectivity; thin films (search for similar items in EconPapers)
Date: 2014
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DOI: 10.1142/S0218625X1450005X

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