EFFECT OF THICKNESS ON MICROSTRUCTURE, DIELECTRIC AND OPTICAL PROPERTIES OF SINGLE LAYERBa0.6Sr0.4TiO3THIN FILM

Veluchamy Eswaramoorthi () and Rayar Victor Williams
Additional contact information
Veluchamy Eswaramoorthi: Department of Physics, St. Joseph's College (Autonomous), Tiruchirappalli 620002, India
Rayar Victor Williams: Department of Physics, St. Joseph's College (Autonomous), Tiruchirappalli 620002, India

Surface Review and Letters (SRL), 2014, vol. 21, issue 02, 1-8

Abstract: Single layeredBa0.6Sr0.4TiO3(BST) thin films were prepared on stainless steel (304) and quartz substrates by solution method. The microstructure, grain size, surface morphology and thickness of the films were reported on the basis of X-ray diffraction (XRD), atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM) and UV-visible spectrometer. Variation in thickness influences the microstructure of the films. The single layered thin film had uniform crack-free surface morphology. The low frequency dielectric constants for the films of thicknesses 663, 476 and 451 nm were found to be 1246, 859 and 703, respectively at room temperature. The dielectric loss values for different thicknesses were found to be 0.238%, 0.170% and 0.120% for 100 kHz and 0.043%, 0.029 % and 0.028% for 1 kHz. The dielectric properties changed significantly with thickness of the film as well as with frequency. The tunability of the single layered BST film increased with film thickness. The refractive index, bandgap and thickness of the single layered thin film were calculated by using envelope method and Tauc's relation from the UV-visible transmission spectrum. The bandgap increases with the film thickness. These results show that this single layered film will be a potential material for tunable devices application.

Keywords: Single layer; optimization; BST; dielectric; optical (search for similar items in EconPapers)
Date: 2014
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X14500206
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:21:y:2014:i:02:n:s0218625x14500206

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X14500206

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().