EFFECT OF ANNEALING ON THE PROPERTIES OF VANADIUM PENTOXIDE FILMS PREPARED BY SOL–GEL METHOD

Yaqiang Liu (), Xuelian Du and Xueqin Liu
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Yaqiang Liu: School of Physics and Electrical Information, Shangqiu Normal University, Shangqiu 476000, P. R. China
Xuelian Du: School of Physics and Electrical Information, Shangqiu Normal University, Shangqiu 476000, P. R. China
Xueqin Liu: Department of Physics, Lanzhou University, Lanzhou 730000, P. R. China

Surface Review and Letters (SRL), 2014, vol. 21, issue 02, 1-6

Abstract: The vanadium pentoxide(V2O5)films were obtained by using sol–gel procedure and then were annealed at different temperature in air. The effect of different annealing temperatures on the composition, the microstructure, the surface morphology and the optical properties of the films were characterized by methods such as by X-ray diffraction, Raman spectroscopy, scanning electron microscopy and spectral transmittance. The results revealed that the film annealed at 150°C has amorphous structure and dense with a smooth surface and the films annealed at 300°C and 450°C have a polycrystallineV2O5structure with preferred growth orientation along (001) planes, thec-axis and perpendicular to the silicon substrate surface. From the spectral transmittance we determined the absorption edge using the Tauc plot. The results indicated that optical bandgap ofV2O5thin films decreased with annealing temperature.

Keywords: Vanadium pentoxide; sol–gel; Raman spectroscopy; optical properties (search for similar items in EconPapers)
Date: 2014
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DOI: 10.1142/S0218625X14500279

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