EFFECTS OFTiOxINTERLAYER ON RESISTANCE SWITCHING OFPt/TiOx/ZnO/n+-SiSTRUCTURES

Hongxia Li, Xiaojun Lv, Junhua Xi, Xin Wu, Qinan Mao, Qingmin Liu and Zhenguo Ji ()
Additional contact information
Hongxia Li: Lab of Electronic Materials and Devices, Hangzhou Dianzi University, Hangzhou 310018, P. R. China
Xiaojun Lv: Lab of Electronic Materials and Devices, Hangzhou Dianzi University, Hangzhou 310018, P. R. China
Junhua Xi: Lab of Electronic Materials and Devices, Hangzhou Dianzi University, Hangzhou 310018, P. R. China;
Xin Wu: School of Mechanical Engineering, Hangzhou Dianzi University, Hangzhou 310018, P. R. China
Qinan Mao: Lab of Electronic Materials and Devices, Hangzhou Dianzi University, Hangzhou 310018, P. R. China
Qingmin Liu: School of Mechanical Engineering, Hangzhou Dianzi University, Hangzhou 310018, P. R. China
Zhenguo Ji: Lab of Electronic Materials and Devices, Hangzhou Dianzi University, Hangzhou 310018, P. R. China;

Surface Review and Letters (SRL), 2014, vol. 21, issue 05, 1-6

Abstract: In this paper, we fabricatedPt/TiOx/ZnO/n+-Sistructures by insertingTiOxinterlayer betweenPttop electrode (TE) andZnOthin film for non-volatile resistive random access memory (ReRAM) applications. Effects ofTiOxinterlayer with different thickness on the resistance switching ofPt/TiOx/ZnO/n+-Sistructures were investigated. Conduction behaviors in high and low resistance state (HRS and LRS) fit well with the trap-controlled space-charge-limited conduction (SCLC) and Ohmic behavior, respectively. Variations of set and reset voltages and HRS and LRS resistances ofPt/TiOx/ZnO/n+-Sistructures were investigated as a function ofTiOxthickness. Switching cycling tests were attempted to evaluate the endurance reliability ofPt/TiOx/ZnO/n+-Sistructures. Additionally, the switching mechanism was analyzed by the filament model.

Keywords: Thin films; resistive switching; interlayer (search for similar items in EconPapers)
Date: 2014
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X14500619
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:21:y:2014:i:05:n:s0218625x14500619

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X14500619

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().