SURFACE MORPHOLOGY AND MICROSTRUCTURAL CHARACTERIZATION OFKClCRYSTALS GROWN IN HALITE–SYLVITE BRINE SOLUTIONS BY ELECTRON BACKSCATTERED DIFFRACTION TECHNIQUES

Jiban Podder, Ritwik Basu, Richard William Evitts () and Robert William Besant
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Jiban Podder: Department of Chemical and Biological Engineering, University of Saskatchewan, 57 Campus Drive, Saskatoon, SK, S7N 5A9, Canada
Ritwik Basu: Department of Mechanical Engineering, University of Saskatchewan, 57 Campus Drive, Saskatoon, SK, S7N 5A9, Canada
Richard William Evitts: Department of Chemical and Biological Engineering, University of Saskatchewan, 57 Campus Drive, Saskatoon, SK, S7N 5A9, Canada
Robert William Besant: Department of Mechanical Engineering, University of Saskatchewan, 57 Campus Drive, Saskatoon, SK, S7N 5A9, Canada

Surface Review and Letters (SRL), 2015, vol. 22, issue 01, 1-9

Abstract: In this paper, a study on the ternaryNaCl–KCl–H2Osystem was carried out by an extractive metallurgy technique from mixed brine solutions of different compositions at room temperature (23°C). The surface morphology and microstructure were examined using a scanning electron microscope (SEM), electron backscattered diffraction (EBSD) and an energy dispersive X-ray (EDX) spectroscopy. The presence of${\rm Na}_{ }^{+}$was found to reduce the stability of the solutions and increase the crystallization induction period, interfacial energy, energy of formation of the nucleus and greatly reduce the nucleation rate ofKClcrystal. The surface morphology ofKClcrystals is significantly changed due to presence of 5 to 10% (w/w) ofNaClas impurities in the binary solutions and shows the formation of co-crystals of different crystallographic orientation ofNaClon theKClsurface. In addition X-ray diffraction studies performed onKClcrystals grown in halite–sylvite binary solutions reveals that these crystals are cubic in nature and its lattice constant is 6.2952 Å when theNaClconcentration is small.

Keywords: Sodium chloride; potassium chloride; Co-crystals; surface texture; electron back scattered diffraction; energy dispersive X-ray (search for similar items in EconPapers)
Date: 2015
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DOI: 10.1142/S0218625X15500122

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