FERROMAGNETISM IN SEMICONDUCTOR C–Ni FILMS AT DIFFERENT ANNEALING TEMPERATURE
Vali Dalouji and
Smohammad Elahi
Additional contact information
Vali Dalouji: Department of Physics, Malayer University, Malayer, Iran
Smohammad Elahi: #x2020;Plasma Physics Research Center, Science and Research Branch, Islamic Azad University, Tehran, Iran
Surface Review and Letters (SRL), 2016, vol. 23, issue 03, 1-8
Abstract:
In this work, the microstructure and magnetic properties of carbon–nickel (C–Ni) composite films annealed at different temperatures (300–1000∘C) were investigated. The films were grown by radio frequency magnetron sputtering on quartz substrates at room temperature. The nickel concentration in the films are affected by changing of the value of evaporation nickel atoms and measured by Rutherford backscattering spectroscopy (RBS). Values of coercive field were measured under both increasing and decreasing applied magnetic field. It is shown that the coercive field of films strongly dependent on the annealing temperature and at 500∘C films has maximum value of 93.67Oe. The difference in the coercive fields increased for films annealed from 300 to 500∘C and then decreased from 500 to 1000∘C. The ID/IG ratio of Raman spectra would indicate the presence of higher sp2 bonded carbon in the films annealed at 800∘C.
Keywords: Carbon–nickel films; annealing temperature; nickel concentration; the coercive field; the electrical resistivity (search for similar items in EconPapers)
Date: 2016
References: View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X16500025
Access to full text is restricted to subscribers
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:23:y:2016:i:03:n:s0218625x16500025
Ordering information: This journal article can be ordered from
DOI: 10.1142/S0218625X16500025
Access Statistics for this article
Surface Review and Letters (SRL) is currently edited by S Y Tong
More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().