INCREASE IN THE REFLECTED INTENSITY OF X-RAY FILMS USING PHOTONIC CRYSTALS

Arafa H. Aly and M. F. Eissa
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Arafa H. Aly: Physics Department, Faculty of Science, Beni-Suef University, Beni-Suef, Egypt
M. F. Eissa: Physics Department, Faculty of Science, Beni-Suef University, Beni-Suef, Egypt

Surface Review and Letters (SRL), 2017, vol. 24, issue 08, 1-5

Abstract: Photographic film is the familiar image of recording X-ray method. Examinations performed with radiographic intensifying screens reduce the patient’s exposure to radiation of X-rays compared with those without radiographic intensifying screens, where it directs less than half of the light emitted from the X-ray film with a screen interaction. A reflective layer made of magnesium oxide or titanium dioxide is located between the screen and the base of the film; this layer can help regain the control of the header light in other directions and is forwarded to the film. One-dimensional array of photonic crystals (PCs) consists of MgO with Al and TiO2 with Al used as reflectors. This array may increase the reflected intensity by an amount of 10.88% if MgO–Al PCs with periodicity N=1 are used as reflectors.

Keywords: Photonic crystals; X-ray; reflected intensity (search for similar items in EconPapers)
Date: 2017
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DOI: 10.1142/S0218625X17501062

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