STRUCTURAL, ELECTRICAL AND OPTICAL PROPERTIES OF TiO2 THIN FILM DEPOSITED ON THE NANO POROUS SILICON TEMPLATE
Mahmood Bahar and
Ensieh Khalili Dermani ()
Additional contact information
Mahmood Bahar: Department of Physics, Islamic Azad University, Tehran North Branch, Tehran, Iran†Faculty of Physics, Kharazmi University, Tehran, Iran
Ensieh Khalili Dermani: #x2020;Faculty of Physics, Kharazmi University, Tehran, Iran
Surface Review and Letters (SRL), 2017, vol. 24, issue Supp02, 1-5
Abstract:
The porous silicon (PSi), which is produced by the electrochemical etching, has been used as a substrate for the growth of the titanium oxide (TiO2) thin films. By using the EBPVD method, TiO2 thin films have been deposited on the surface of the PSi substrate. TiO2/PSi layers were annealed at the temperature of 400∘C, 500∘C and 600∘C for different tests. The morphology and structures of layers were investigated by the scanning electron microscopy (SEM) and X-ray diffraction (XRD). The current–voltage characteristic curves of samples and the ideality factor of heterojunction were studied. The results showed that the electrical properties of the samples change with increase in the annealing temperature. The optical properties of the prepared samples were investigated by using UV–Vis and photoluminescence (PL) spectroscopy. Green light emission of the PSi combined with the blue light and violet–blue emission obtained from the TiO2/PSi PL spectra. The results showed that the optical band gap energy of the PSi has increased from 1.86eV to 2.93eV due to the deposition of TiO2 thin film.
Keywords: Porous silicon; thin films; TiO2/PSi (search for similar items in EconPapers)
Date: 2017
References: View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X18500178
Access to full text is restricted to subscribers
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:24:y:2017:i:supp02:n:s0218625x18500178
Ordering information: This journal article can be ordered from
DOI: 10.1142/S0218625X18500178
Access Statistics for this article
Surface Review and Letters (SRL) is currently edited by S Y Tong
More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().