MORPHOLOGICAL, STRUCTURAL AND OPTICAL CHARACTERIZATIONS OF Zn-DOPED CdS BUFFER LAYER ELABORATED BY CHEMICAL BATH DEPOSITION

H. Cheriet, H. Moualkia, R. Barille, M. Zaabat, O. Mahroua and M. Trari
Additional contact information
H. Cheriet: Laboratory of Materials and Structure of Electromechanical Systems and Reliability, Faculty of Science and Applied Science, University Larbi Ben M’Hidi, Oum El Bouaghi, Algeria
H. Moualkia: Laboratory of Materials and Structure of Electromechanical Systems and Reliability, Faculty of Science and Applied Science, University Larbi Ben M’Hidi, Oum El Bouaghi, Algeria
R. Barille: #x2020;Laboratory Moltech-Anjo, University D’Angers, France
M. Zaabat: #x2021;Laboratory of Active Components and Materials, Faculty of Science and Science of Nature and Life, Larbi BenEl M’hidi Oum El Bouaghi, Algeria
O. Mahroua: #xA7;Laboratory of Storage and Valorization of Renewable Energies, Faculty of Chemistry, U.S.T.H.B, BP 32 El-Alia 16111 Algiers, Algeria
M. Trari: #xA7;Laboratory of Storage and Valorization of Renewable Energies, Faculty of Chemistry, U.S.T.H.B, BP 32 El-Alia 16111 Algiers, Algeria

Surface Review and Letters (SRL), 2020, vol. 27, issue 11, 1-10

Abstract: Zn-doped CdS layers, with various percentage ratios R (= [Zn2+]/[Cd2+]%) were grown on glass substrates by chemical bath deposition (CBD). The effect of Zn-doping on different properties of CdS is studied by X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy, atomic force microscopy, energy dispersive X-ray analysis and UV-visible diffuse reflectance. The XRD patterns indicated polycrystalline films with (111) orientation and the insertion of Zn does not change the crystallinity of CdS. The Raman spectra show one major peak centered around 300cm−1 assigned to the first-order longitudinal optic (LO) phonon modes of CdS. The surface morphology visualized by AFM and SEM analysis showed the influence of the Zn-doping on the morphology of the films, the surface roughness is found to decrease from 16.5 to 8.9nm with augmenting the ratio R from 0 to 6%. In regard to the SEM analysis, the increase of R yielded a lower porosity of the film and voids, and the films become more homogeneous. The EDAX spectra confirmed the existence of Zn in the doped samples. The bandgap decreases from 2.44 to 2.37eV, while the transmittance increases from 76 to 86% with augmenting the ratio R.

Keywords: Zn-doped CdS; thin films; chemical bath deposition; Raman spectroscopy; growth of buffer layers (search for similar items in EconPapers)
Date: 2020
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X20500092
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:27:y:2020:i:11:n:s0218625x20500092

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X20500092

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().