EFFECT OF LATTICE MISMATCH ON THE MICROSTRUCTURE AND ELECTRICAL PROPERTIES OF LaNiO3 CONDUCTIVE FILMS

M. W. Zhu, B. D. You, D. C. Shi, T. N. Lu, J. N. Wang, N. Jia and C. Z. Liu
Additional contact information
M. W. Zhu: School of Material Science and Engineering, Shenyang Aerospace University, Shenyang 110136, P. R. China
B. D. You: School of Material Science and Engineering, Shenyang Aerospace University, Shenyang 110136, P. R. China
D. C. Shi: ��Key Laboratory for Anisotropy and Texture of Materials (ATM) Northeastern University, Shenyang 110819, P. R. China
T. N. Lu: School of Material Science and Engineering, Shenyang Aerospace University, Shenyang 110136, P. R. China
J. N. Wang: School of Material Science and Engineering, Shenyang Aerospace University, Shenyang 110136, P. R. China
N. Jia: ��Key Laboratory for Anisotropy and Texture of Materials (ATM) Northeastern University, Shenyang 110819, P. R. China
C. Z. Liu: School of Material Science and Engineering, Shenyang Aerospace University, Shenyang 110136, P. R. China

Surface Review and Letters (SRL), 2022, vol. 29, issue 09, 1-9

Abstract: In this work, we prepared LaNiO3 (LNO) and Au-LaNiO3 (Au-LNO) films using sol–gel multilayer coating method. The effects of lattice mismatch on the microstructure and electrical properties of the films were investigated by choosing different single-crystal substrate. XRD, SEM, and AFM results showed the high quality of LNO and Au-LNO films, indicating the successful epitaxial growth of the films on the single-crystal substrates. The room temperature resistivity of LNO films increased with the increase of lattice mismatch while different tendency was observed in Au-LNO films, suggesting that different mechanisms prevailed in the LNO and Au-LNO films. Both the transport behavior and the residual resistivity ratio were checked to explore the relationship between the lattice mismatch and the electrical properties of the films. Strain and defect concentration were proposed as the predominating factors for the changes in the resistivity of LNO and Au-LNO films under the influence of lattice mismatch.

Keywords: Conductive oxide; sol gel process; lattice mismatch; strain; defect concentration (search for similar items in EconPapers)
Date: 2022
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X22501232
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:29:y:2022:i:09:n:s0218625x22501232

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X22501232

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().