Quality Performance Modeling in a Deteriorating Production System with Partially Available Inspection

Israel Tirkel () and Gad Rabinowitz ()
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Israel Tirkel: Ben-Gurion University of the Negev
Gad Rabinowitz: Ben-Gurion University of the Negev

A chapter in Operations Research Proceedings 2010, 2011, pp 397-402 from Springer

Abstract: Abstract This work studies quality output of a production system applying simulation and analytical models. It originates in semiconductors, but can be adapted to other industries. We investigate the impact of Inspection Policies (IP) on Flow-Time (FT) and quality, as measured by Out-Of-Control (OOC). Results indicate that growing inspection rate reduces OOC and increases FT until OOC is minimized, then OOC starts to grow while FT continues to increase. Dynamic IP)s are superior to the known static IP. Maximum inspection rate or inspection utilization does not acheive minimum OOC. Operation and repair times variability affect OOC more than their statistical functions.

Keywords: Repair Time; Inspection Time; Wafer Fabrication; Availability Level; Inspection Rate (search for similar items in EconPapers)
Date: 2011
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Persistent link: https://EconPapers.repec.org/RePEc:spr:oprchp:978-3-642-20009-0_63

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DOI: 10.1007/978-3-642-20009-0_63

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