Fitting lines and curves to data, least squares method

C. Mack
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C. Mack: Institute of Technology, Applied Mathematics

Chapter 12 in Essentials of Statistics for Scientists and Technologists, 1966, pp 106-115 from Springer

Abstract: Abstract In scientific and technological work we often have to measure two quantities, one of which is subject to a certain amount of unpredictable variation, often called ‘scatter’ (e.g. the yield in some chemical reactions is frequently subject to scatter), whereas the other quantity can be determined beforehand exactly (e.g. the Figure 12.1. Diagram showing the errors ε1 ε2,… when a line is fitted to data with scatter temperature or the duration of a reaction can be determined exactly, but the yield often cannot). The problem then is to find the true relation between the two quantities (e.g. exactly how does the yield vary with temperature).

Date: 1966
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DOI: 10.1007/978-1-4615-8615-9_12

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