Electrical Breakdown and the Breakdown Formalism

James U. Gleaton (), David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
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David Han: University of Texas at San Antonio, Management of Science and Statistics
James D. Lynch: University of South Carolina, Department of Statistics
Hon Keung Tony Ng: Bentley University, Department of Mathematical Sciences
Fabrizio Ruggeri: Consiglio Nazionale delle Ricerche, Istituto di Matematica Applicata e Tecnologie Informatiche

Chapter Chapter 5 in Fiber Bundles, 2022, pp 59-63 from Springer

Abstract: Abstract In the testing of capacitors and capacitor circuits, one is interested in their reliability. Thus, one studies various types of breakdowns under accelerated stress conditions: e.g., stressed under increasing voltage or current to determine voltage or current breakdown (VBD or CBD) and time to failure under static voltage or current load or cycles to failure. The BD formalism allows one to relate BD under different testing protocols and to project the reliability to normal operating conditions.

Date: 2022
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DOI: 10.1007/978-3-031-14797-5_5

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